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   -> Volume 7, Issue 2

Meeting: Nonlinear Modeling (Leuven, Belgium)
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Yu Yi (

PostPosted: Tue Feb 10, 1998 7:37 am    
Subject: Meeting: Nonlinear Modeling (Leuven, Belgium)
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#8 Meeting: Nonlinear Modeling (Leuven, Belgium)

International Workshop on

Advanced Black-Box Techniques for Nonlinear Modeling: Theory and

with Time-Series Prediction Competition

Date: July 8-10, 1998
Place: Katholieke Universiteit Leuven, Belgium

Organized at the Department of Electrical Engineering (ESAT/SISTA) and
the Interdisciplinary Center for Neural Networks (ICNN) in the
framework of the project KIT and the Belgian Interuniversity
Attraction Pole IUAP P4/02. In cooperation with the IEEE Circuits and
Systems society.

General Scope

The rapid growth of the field of neural networks, fuzzy systems and
wavelets is offering a variety of new techniques for modeling of
nonlinear systems in the broad sense. These topics have been
investigated from differents points of view including statistics,
identification and control theory, approximation theory, signal
processing, nonlinear dynamics, information theory, physics and
optimization theory among others. The aim of this workshop is to serve
as an interdisciplinary forum for bringing together specialists in
these research disciplines. Issues related to the fundamental theory
as well as real-life applications will be addressed at the workshop.

Time-Series Prediction Competition

Within the framework of this workshop a time-series prediction
competition will be held. The results of the competition will be
announced during the workshop, where the winner will be
awarded. Participants in the competition are asked to submit their
predicted data together with a short description and references of the
methods used. In order to stimulate wide participation in the
competition, attendance of the workshop is not mandatory but is of
course encouraged.

Invited Speakers (Confirmed)

* L. Feldkamp (Ford Research, USA) - Extended Kalman filtering
* C. Micchelli (IBM T.J. Watson, USA) - Density estimation
* U. Parlitz (Gottingen, Germany) - Nonlinear time-series analysis
* J. Sjöberg (Goeteborg, Sweden) - Nonlinear system identification
* S. Tan (Beijing, China) - Wavelet-based system modeling
* M. Vidyasagar (Bangalore, India) - Statistical learning theory
* V. Wertz (Louvain-la-Neuve, Belgium) - Fuzzy modeling

A book containing the invited talks and the time-series competition
will be published by Kluwer Academic Publishers and will be available
at the workshop.

Topics include but are not limited to:

Nonlinear system identification Backpropagation
Time series analysis Learning and nonlinear optimization
Multilayer perceptrons Recursive algorithms
Radial basis function networks Extended Kalman filtering
Fuzzy modelling Embedding dimension
Wavelets Subspace methods
Piecewise linear models Identifiability
Mixture of experts Model selection and validation
Universal approximation Simulated annealing
Recurrent networks Genetic algorithms
Regularization Forecasting
Bayesian estimation Frequency domain identification
Density estimation Classification
Information geometry Real-life applications
Generalization Software

Paper Submission

Prospective authors are invited to submit five copies of their paper to
Johan Suykens (see Chairman). Papers have to be submitted in camera-ready
form and should not exceed six pages (including references and figures).
Authors are asked to use the two-column LaTeX style file kit.sty.


Hotel Information

Travel Information

* Maps of Leuven and ESAT department
* Detailed map of Leuven (in Dutch)
* Belgian Tourist information (Airlines, Public transport, weather,
exchange rates, ...)

Important Dates

Deadline paper submission: April 2, 1998
Notification of acceptance: May 4, 1998
Workshop: July 8-10, 1998

Deadline data submission for Time-Series competition: March 20, 1998


Johan Suykens
Katholieke Universiteit Leuven
Departement Elektrotechniek - ESAT/SISTA
Kardinaal Mercierlaan 94
B-3001 Leuven (Heverlee), Belgium
Tel: +32-16-32 18 02
Fax: +32-16-32 19 70

Program Committee

B. De Moor, E. Deprettere, D. Roose, J. Schoukens, S. Tan, J. Vandewalle, V.
Wertz, Y. Yu
All times are GMT + 1 Hour
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